The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 1990

Filed:

Jun. 01, 1989
Applicant:
Inventors:

Dolores U Olness, Livermore, CA (US);

Tomas B Hirschfeld, deceased, late of Livermore, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; H01L / ;
U.S. Cl.
CPC ...
324623 ; 324557 ; 310327 ;
Abstract

A method and apparatus for monitoring the degradation of elastomeric materials is provided. Piezoelectric oscillators are placed in contact with the elastomeric material so that a forced harmonic oscillator with damping is formed. The piezoelectric material is connected to an oscillator circuit,. A parameter such as the resonant frequency, amplitude or Q value of the oscillating system is related to the elasticity of the elastomeric material. Degradation of the elastomeric material causes changes in its elasticity which, in turn, causes the resonant frequency, amplitude or Q of the oscillator to change. These changes are monitored with a peak height monitor, frequency counter, Q-meter, spectrum analyzer, or other measurement circuit. Elasticity of elastomers can be monitored in situ, using miniaturized sensors.


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