The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 1990
Filed:
Sep. 13, 1988
Vladimir Blazek, Aachen, DE;
Jurgen Seidenberg, Aachen, DE;
U.S. Philips Corporation, New York, NY (US);
Abstract
A rapid and simple opto-electronic measuring method of determining the wavelength and the wavelength-corrected power of monochromatic light sources is indicated. The photodetectors (1, 2) of different spectral overall sensitivity are acted upon through a transfer device by the flow of radiation of the light source to be measured, and the signals (I1, I2) then produced are supplied through a unit (3) for acquisitioning and processing the measurement values to a calculation unit (4). From the signals (I1, I2) a wavelength-specific quantity is derived in the calculation unit which is compared with the wavelength-specific data present in memory unit (6) after one calibration. Thus, the actual wavelength of the light source to be measured can be determined, be indicated by an indicator unit (7), or be supplied through a data interface. When the actual wavelength is known, a wavelengh-specific correction factor can be interrogated in the memory unit, and a wavelength-corrected power can be calculated in the calculation unit. FOr actuation of the photodetectors (1, 2), a radiation splitter, light wave guides with corresponding connection members of Ulbricht balls can be used.