The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 1990
Filed:
Nov. 25, 1987
Paul R Yoder, Jr, Wilton, CT (US);
Taunton Technologies, Inc., Monroe, CT (US);
Abstract
A contour measuring apparatus and method of using the apparatus is disclosed to measure the three-dimensional contour of a surface. A multi-point light source directs a plurality of light beams onto the surface to be measured. The light beams are reflected through a lens onto a photodetector to produce electro-optically measurable optical images. A structure is provided to determine the local radius of curvature of the surface at each desired point of incidence of individual light beams and the three-dimensional surface contour of the surface being measured. A calibration device is provided to reduce instrument errors of the apparatus. The calibration device includes a calibration surface with a known contour to be positioned in substitution of the surface being measured. The apparatus includes a structure to sequentially determine and store a memory of the location of the calibration surface and to compare the reflection of the light from the calibration surface as well as the surface being measured to determine the contour of the surface being measured.