The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 1990

Filed:

Oct. 04, 1988
Applicant:
Inventor:

Alan L Shinn, Berkeley, CA (US);

Assignee:

Allergan Humphrey, San Leandro, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351208 ; 351210 ;
Abstract

In an instrument having an interrogating optical beam for the measurement of various optical properties of the eye, a detector is disclosed for triangulating the towards and away distance of the eye from the objective of the measurement equipment thus utilizing the beam for serendipitous purpose of ranging. A photosensitive detector having two photosensitive elements is placed in a plane which includes the optical axis of the interrogating instrument and the detector. The detector is mounted towards the eye with the division between the two photosensitive surfaces normal to the plane including the interrogating optical beam and the detector. Typically, the detector has line of sight off axis with respect to the interrogating beam and intersects the axis at the preferred position for eye placement. An imaging lens relays a conjugate image of the detector to that point in space on the optic axis in front of the eye where ultimate placement of the eye for measurement is desired. By the simple expedient of moving servomotor to obtain a quality of signal between the photosensitive portions of the detector, rapid positioning of the eye can occur.


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