The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 1990

Filed:

Jan. 30, 1989
Applicant:
Inventors:

John Fain, Louisville, KY (US);

Patrick R Lancaster, IV, Louisville, KY (US);

Assignee:

Lantech, Inc., Louisville, KY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01L / ;
U.S. Cl.
CPC ...
73795 ; 73159 ;
Abstract

A method and apparatus for testing the properties of stretch film include collapsing a web of stretch film into a rope, anchoring the rope web at two locations and stretching an intermediate portion of the rope web a first distance in a first direction between the locations where it is anchored. The intermediate portion of the stretched roped web is displaced a second distance along a second direction transverse to the first direction and relative to the locations where it is anchored, and the tension force in the stretched roped web is measured when it is displaced the second distance. Alternatively, peripheral portions of a sheet of stretch film are secured and a central portion of the sheet of stretch film is engaged and deformed a third distance in the second direction.


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