The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 1990

Filed:

May. 19, 1988
Applicant:
Inventors:

Akira Hirano, Hidaka, JP;

Shinichi Watanabe, Sayama, JP;

Yutaka Fukuda, Tokorozawa, JP;

Yukio Higuchi, Fuji, JP;

Fumio Shibano, Sakado, JP;

Hiroshi Sekino, Tokyo, JP;

Hiroichi Nabeshima, Hidaka, JP;

Yukimasa Nishizawa, Iruma, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
73117 ; 3320313 ;
Abstract

A roller clamp type wheel examining apparatus includes a support for supporting thereon a wheel of a vehicle to be examined, a plurality of rollers for clamping the wheel supported on the support from both sides thereof and an angle detector for detecting the angle of orientation of the wheel when clamped by the plurality of rollers. The wheel of a vehicle clamped by the rollers on both sides thereof may be driven to rotate around its own rotating axis to thereby examine dynamic characteristics of the wheel. In this case, the support structure should, for example, include a pair of support rollers for supporting thereon the wheel to be examined in a rotatable manner. The support may include a floating table having a flat top support surface and movable in a horizontal plane translationally as well as rotationally, in which case only the dynamic characteristics of the wheel may be examined since the wheel is not rotatable around its rotating axis.


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