The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 1990

Filed:

Nov. 24, 1987
Applicant:
Inventors:

Shinichi Miyake, Osaka, JP;

Masayuki Kometani, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324438 ; 324 714 ; 324 711 ;
Abstract

A particle analyzer which comprises a constricted passage for the passage of fine particles contained in a suspension therethrough for isolation, upstream and downstream passages communicated with the constricted passage and positioned on upstream and downstream sides of the constricted passage with respect to the direction of flow of the suspension, a detector including upstream and downstream electrodes disposed in the upstream and downstream passages, respectively, so as to confront with each other for detecting the fine particles being passed through the constricted passage, and a cleansing passage communicated with either one of the upstream and downstream passages for the supply of a cleansing liquid.


Find Patent Forward Citations

Miyake, Shinichi. (1990). Apparatus for analyzing and separating particles and a system using the (U.S. Patent No. 4901024). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4901024

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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