The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 1990
Filed:
Aug. 19, 1988
Applicant:
Inventors:
William E Benedetto, Succasunna, NJ (US);
Joseph M Moran, Berkeley Heights, NJ (US);
Assignee:
American Telephone and Telegraph Company, AT&T Bell Laboratories, Murray Hill, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 3241 / ; 324 731 ;
Abstract
An apparatus for testing of electrical circuits has a buckling beam probe assembly having advantageous features that make it useful for contacting area arrays of test points, and for reliably establishing contact therewith. The probe elements remain essentially parallel even in the buckled state, and the probe tips execute a small 'wiping' movement on the contact point. In some preferred embodiments the probe tips are shaped to result in reduced contact area.