The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 1990

Filed:

May. 30, 1989
Applicant:
Inventor:

Hermann Gerlinger, Aalen, DE;

Assignee:

Carl-Zeiss-Stiftung, Heidenheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
250228 ; 356236 ;
Abstract

The invention is directed to a reflectance measuring apparatus having a predetermined aperture for the receiving optic. A light-conducting device arranged between the measuring aperture and the specimen enlarges the effective measuring surface of the latter so that even specimens having a large surface structure can be measured without difficulty.


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