The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 1990
Filed:
Jan. 23, 1989
Joseph D Titlow, Boulder, CO (US);
Wilmut Brost, Northglenn, CO (US);
David T Hahn, Longmont, CO (US);
Micro Motion Incorporated, Boulder, CO (US);
Abstract
Method and apparatus for determining Young's Modulus of a specimen by measuring the speed at which stress waves, either P-waves or S-waves, propagate therein. An embodiment of the apparatus includes two fixtures which are removably affixed to opposite ends of the specimen. A hammer having an accelerometer affixed to its head is used to strike the first fixture to produce stress waves in the specimen. A timing means starts counting in response to an output generated by the accelerometer when the hammer strikes the first fixture. A second accelerometer affixed to the second fixture detects the stress waves and generates an output which causes the timing means to stop counting. Further circuitry extracts the measured time, calculates a dispersion time delay based on material and length, and subtracts the dispersion time delay and a predetermined constant, both dependent on the material in the specimen, from the measured time to form a corrected transit time. The circuitry uses the corrected transit time to determine the propagation speed of the stress waves and Young's Modulus therefrom.