The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 1990
Filed:
Oct. 21, 1987
Applicant:
Inventors:
N C Lai, Brookfield, WI (US);
Edward J Zuperku, Elm Grove, WI (US);
Roy A Henning, Milwaukee, WI (US);
Assignee:
Criticare Systems, Inc., Waukesha, WI (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
250343 ; 250573 ; 356437 ;
Abstract
A non-dispersive infrared gas analyzer of the type typically used to measure concentrations of gases in medical and industrial applications has no moving parts and employs two or more miniature infrared sources ('microsources') which are electrical current-modulated to produce modulated infrared radiation for synchronous detection. The microsources are operated at different frequencies. The frequency-multiplexed detector signal is demodulated and ratioed to yield an output which is correlated to the gas concentration in the sampler chamber.