The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 1990

Filed:

May. 24, 1988
Applicant:
Inventor:

David M Kramer, Rancho Palos Verdes, CA (US);

Assignee:

Hi-Shear Corporation, Torrance, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250227 ; 250225 ; 356 731 ;
Abstract

An optical system for individually testing each one of a plurality of fibers for continuity. Each fiber having a proximal end and a distal end with a dichroic reflector at each distal end reflective of wavelengths respective to a source of testing light and transmissive to other wavelengths. The selection of which fiber is to be tested is only a matter of manipulating a rotator element which has the capacity to rotate the angle of polarization by 90 degrees. The polarization of the light determines the respective fiber to be tested.


Find Patent Forward Citations

Kramer, David. (1990). Multiple channel fiber optic continuity test system (U.S. Patent No. 4899045). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4899045

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…