The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 1990

Filed:

Feb. 16, 1988
Applicant:
Inventors:

Haruo Yoda, Tokyo, JP;

Hidenori Inouchi, Kokubunji, JP;

Hiroshi Sakou, Shiki, JP;

Yozo Ohuchi, Higashiyamato, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364488 ; 364555 ; 382 47 ; 382 23 ; 382-8 ; 377 10 ;
Abstract

A digital image analysis system is disclosed in which a digital input image formed by a raster scan method is so modified as to fill up a hole in a clump and a recess at the bottom of a clump viewed in the sub-scanning direction of the raster scan method, for the purpose of forming a control image, the state of a clump at two consecutive scanning lines of the control image (that is, the generation and termination of the clump at one of the scanning lines or the continuity of the clump at the scanning lines) is detected from the values of adjacent pixels on the two consecutive scanning lines, and a feature value of the clump is calculated on the basis of the detected state of the clump.


Find Patent Forward Citations

Loading…