The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 1990

Filed:

May. 16, 1988
Applicant:
Inventors:

Stephen J Young, Milpitas, CA (US);

Mike K Blackwell, Pittsburgh, PA (US);

Kevin J Dowling, Pittsburgh, PA (US);

Hans P Moravec, Pittsburgh, PA (US);

Lada Zajicek, Fremont, CA (US);

Assignee:

Apple Computer, Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358139 ; 358 10 ;
Abstract

The present invention is an automated testing apparatus and process for screen alignment involving a pattern generator, sensors, and an analysis computer. Two sets of patterns are displayed on the screen being tested. Sensors are used to observe patterns on the screen. An analysis computer receives the data from these observations and then compares the observed data to data from an ideal screen to determine the screen's alignment parameters.


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