The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 1990

Filed:

Feb. 11, 1988
Applicant:
Inventors:

Motohide Kokunishi, Tokyo, JP;

Tetsuzou Uehara, Tokyo, JP;

Satoru Sakamoto, Ome, JP;

Mamoru Tada, Kadaira, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G / ;
U.S. Cl.
CPC ...
340751 ; 340731 ;
Abstract

Skeleton pattern data and stroke thickness data are stored for each character composed of a plurality of strokes, and desired skeleton pattern data are converted into skeleton data enlarged or reduced by a scaling factor. Thickness data of the strokes after the scaling are generated based on the stroke thickness data and the scaling factor. An outline of each stroke of the character is generated based on the skeleton pattern data and the stroke thickness data to thereby generate outline pattern data of the character. When generating the outline pattern data based on the skeleton pattern data, a value different from the scaling factor for the skeleton pattern data is determined as a thickness scaling factor for the stroke of the character.


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