The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 1990
Filed:
Jun. 15, 1989
Applicant:
Inventor:
Yuji Ito, Chigasaki, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356 73 ; 2504612 ; 356339 ; 356417 ;
Abstract
A particle analyzing apparatus has an irradiating optical system for irradiating a particle to be examined with a light beam, a measuring optical system for measuring the light scattered by the particle, a device provided in the irradiating optical system for varying the form of the light beam, and a device provided at a position in the measuring optical system optically conjugate with the position of the particle to be irradiated with the light beam and adapted for varying the form of viewing field when the form of the light beam is varied.