The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 1990
Filed:
Mar. 18, 1988
Mitoshi Fukumoto, Tokyo, JP;
Matsuzawa Seiki Kabushikikaisha, Tokyo, JP;
Abstract
A material testing machine includes two detecting means of indenter pressing force detecting means provided with a displacement detector or a strain gage type detector and amount of penetration detecting means provided with a displacement detector. When it is detected by a pulse that the output of the detector of the indenter pressing force detecting means has reached a predetermined value, the output of the detector of the amount of penetration detecting means is latched by the pulse and latched output is used as the output of the amount of pentration detecting means. In a further embodiment, the two detectors are provided with a pulse generator and counting means for counting pulses generated therefrom. When it is detected by a pulse that the output of the detector of the indenter pressing force detecting means has reached a predetermined value the counting means of the amount of penetration detecting means is controlled by the pulse and the output of the counting means is used as the output of the amount of penetration detecting means.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile