The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 1990

Filed:

Mar. 16, 1988
Applicant:
Inventors:

Rainer Kraus, Munich, DE;

Oskar Kowarik, Grafing, DE;

Kurt Hoffmann, Taufkirchen, DE;

Manfred Paul, Unterfoehring, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11K / ;
U.S. Cl.
CPC ...
371 212 ; 365200 ; 365201 ;
Abstract

In a circuit configuration and a method for testing storage cells, all of the bit lines lead to one pair of fault lines which is first precharged with mutually-complementary logic levels. All of the storage cells of a word line are always read-out in parallel relative to one another. In the event of 'no fault' the pair of fault lines retains its logic states, whereas in the case of a fault one of the fault lines changes its logic state through switching transistors. This is recognized and analyzed by a comparator circuit in the form of an XOR-circuit or an XNOR-circuit.


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