The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 1990
Filed:
Mar. 09, 1989
John G Mitchell, Trumansburg, NY (US);
NCR Corporation, Dayton, OH (US);
Abstract
A center-to-center distance measuring device for measuring the exact spacing between print solenoids. The devie uses a test block having a top surface and a bottom surface which are parallel. The top surface has first and second bevel surfaces which are parallel to each other, extend from the top surface towards the bottom surface and are spaced apart at a predetermined distance. The print solenoids are positioned perpendicularly to the top surface of the test block such that the print wires of the print solenoids impact against the test block when energized. The displacement of the print wires from the solenoids is used to determine the center-to-center spacing as the print wires impact against the bevel surfaces as the test block is moved.