The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 1990
Filed:
Oct. 27, 1987
Osamu Ishikawa, Kyoto, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
A device for measuring characteristics of a semiconductor device using a noise measurement system and an impedance measuring system includes an input probe and an output probe for providing connection to the semiconductor device. The device also includes first and second variable impedance devices for respectively varying a source and a load impedance, and respectively connected to the input and output probing devices. First and second switching devices are respectively connected to the first and second variable impedance devices. The switching devices selectively connect the first and second variable impedance devices to the noise measurement system, and selectively connect the first and second variable impedance devices to the impedance measuring system.