The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 1990
Filed:
Aug. 22, 1988
Paul A Braun, Simi Valley, CA (US);
Michael W Ormsby, Thousand Oaks, CA (US);
Gary L De Zotell, Simi Valley, CA (US);
View Engineering, Inc., Simi Valley, CA (US);
Abstract
A can top measuring system is disclosed, including a rotatable turntable (40) containing can top receiving apertures (44). The turntable (40) may also be translated in either the X or Y direction. A differential height sensor (50) surrounds the can top (70) in order that two laser ranger finders (51,52) may emit beams toward opposite sides of the can top (70), the reflected beams being sensed by two dimensional detector arrays (58, 60). Height measurements can also be accomplished by an autofocusing optical system (28) movable along the Z axis. A score line (76) depth in the can top (70) may be measured by observing the characteristic sinusoidal variation (94) of a beam (93) scanned transversely across the score line (76). A node (96) resides on the score line (76) centerline (95), which can thus be scanned as reprsentative of the deepest portion (91) of the score line (76).