The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 1989
Filed:
Apr. 11, 1988
Jacobus J Van Veen, Amsterdam, NL;
Johan W Konig, Noordwijk, NL;
Willem M Ter Kuile, Delft, NL;
Cornelis Van Dijk, Bennekom, NL;
Abstract
A method and an apparatus for detecting low concentrations of at least one (bio-) chemical component present in a test medium in a test cell, having a metal layer as sub wall with an external glass prism, using the surface plasmon resonance effect. A light ray is coupled in and, after attenuated total reflection, is coupled out and the intensity thereof is measured. The incidence angle position of the resonance curve is determined under the influence of the change, caused by the component, in the dielectric constant of the test medium near the metal layer. An adjustable selector is applied to the metal layer, in order to influence the incidence angle position of the resonance curve, through which the concentrations or concentration changes of one or more components in the test medium can be simultaneously determined through one or more differential measurements. A preferential association and therefor a higher concentration at the metal layer of one component above another is brought about.