The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 1989
Filed:
Nov. 12, 1987
Applicant:
Inventors:
Mark H Kryder, , US;
Han-Ping D Shieh, , US;
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 13 ; 365122 ; 360 57 ; 369100 ;
Abstract
Method and system for overwriting binary data values in microscopic storage regions of a thin film ferrimagnetic layer without using external magnetic bias aiding the recording process. The ferrimagnetic layer is selected having a compensation temperature at least a few tens of degrees above room temperature. In recording data, any previously recorded data is erased to establish a known state and magnetic domains of reverse magnetic polarity are recorded when the known state differs from the binary data state by temporarily heating an area on the ferrimagnetic layer above the compensation temperature in the absence of any external aiding magnetic bias.