The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 1989
Filed:
Nov. 19, 1985
Applicant:
Inventors:
Tetsuo Tada, Itami, JP;
Hideo Matsui, Itami, JP;
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364550 ; 364579 ; 364580 ; 371 251 ; 371 271 ; 324 / ;
Abstract
A semiconductor test system comprises an expected value storage area for storing expected values of output data supplied from a semiconductor device under test, a memory device for storing output data directly supplied from the semiconductor device under test in the form of the identical code with that of the expected value storage area, and a comparator for comparing output data from the memory device directly with expected values from the expected value storage area without any conversion.