The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 1989

Filed:

Mar. 04, 1987
Applicant:
Inventors:

Tomio Wakasugi, Hachioji, JP;

Hideshi Tanaka, Koganei, JP;

Assignee:

Hewlett Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
364482 ; 324 / ; 324 / ; 324 / ;
Abstract

An apparatus is disclosed for providing the projections of signals supplied to two inputs on mutually perpendicular axises by applying a different combination of the signals respectively at said input terminals and quadrature phases of an AC wave to each of four phase detectors or by applying each combination in sequence to each phase detector. Means are provided for calculating impedances from the outputs of the phase detectors when the voltages applied to the inputs are respectively those appearing across an unknown impedance and a calibrated resistor that is in series with it, there being an AC voltage applied across the series circuit.


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Wakasugi, Tomio. (1989). Apparatus for measuring vector voltage ratio (U.S. Patent No. 4888701). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4888701

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