The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 1989
Filed:
Mar. 31, 1988
Applicant:
Inventor:
Wayne R Chism, Greeley, CO (US);
Assignee:
Hewlett-Packard Company, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324 / ; 341120 ; 371 225 ;
Abstract
A device and process for programmatically controlled in-circuit pin checks and gross functionality tests of digital to analog converters. The tests provide deterministic bit checks for higher order bits and non-deterministic or 'delta' bit checks of low order bits independent of other circuitry on the printed circuit board of which the digital to analog converter is a component.
Chism, Wayne. (1989). Programmatically generated in-circuit test of digital to analog (U.S. Patent No. 4888548). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4888548
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile