The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 1989

Filed:

Sep. 15, 1987
Applicant:
Inventor:

Martin F Finlan, Aylesbury, GB;

Assignee:

Amersham International plc, Buckinghamshire, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01N / ;
U.S. Cl.
CPC ...
356335 ; 356345 ;
Abstract

The apparatus comprises a cell 2 containing the sample 1 under investigation. Electromagnetic waves P1,P2 are applied from opposite directions and interfere with one another in the region of the cell to form a standing wave pattern 6. DUe to electrostriction effects the standing wave pattern causes particles within the sample to concentrate in certain areas in a pattern corresponding to that of the standing wave 6. This pattern of particle concentration forms a grating when seen by an input wave Pin of electromagnetic wave radiation and, provided conditions are correct, results in the generation of a phase conjugate wave Pout. Means (not shown) are provided for measuring the intensity of the phase conjugate wave Pout which gives a sensitive measure of the size of the particles suspended in the sample.


Find Patent Forward Citations

Loading…