The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 1989
Filed:
Sep. 27, 1988
Applicant:
Inventors:
Maurits W Van Tol, Almelo, NL;
Johannes H Buter, Almelo, NL;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
378 82 ; 378 70 ;
Abstract
Using a belt transmission and guide wheels, a linear drive for a detector arm of an X-ray monochromator is simply obtained, the angle between the detector arm and the crystal arm always being accurately equal to the angle between the crystal arm and the entrance slit.
Van Tol, Maurits. (1989). X-ray analysis apparatus (U.S. Patent No. 4885760). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4885760
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile