The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 1989
Filed:
Mar. 03, 1989
Applicant:
Inventors:
Hideshi Tanaka, Hachioji, JP;
Kazuyuki Yagi, Hachioji, JP;
Shigeru Tanimoto, Hachioji, JP;
Yasuaki Komatsu, Hachioji, JP;
Koichi Yanagawa, Hachioji, JP;
Yoichi Kuboyama, Hachioji, JP;
Assignee:
Hewlett-Packard Company, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06G / ; G01R / ;
U.S. Cl.
CPC ...
324 / ; 364802 ;
Abstract
The present invention relates to apparatus for measuring the AC electrical parameters of a circuit element (Device-Under-Test, DUT), such as a resistor, a capacitor or an inductor, at the desired frequency of a signal while applying a DC bias to the DUT. The present invention provides an apparatus capable of measurement with less error even in the lower-frequency range.
Tanaka, Hideshi. (1989). Apparatus which uses a simulated inductor in the measurement of an (U.S. Patent No. 4885528). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4885528
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile