The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 1989
Filed:
Nov. 19, 1987
Walter L Beckwith, Jr, Warwick, RI (US);
Brown & Sharpe Manufacturing Company, North Kingstown, RI (US);
Abstract
A calibration system for measuring the parametric errors in a coordinate measuring machine having a first element and a table which are movable in three dimensions relative to each other. The apparatus comprises a reflector assembly attachable to the first element, a laser measuring assembly attachable to the table for directing a plurality of laser beams at the reflector assembly and for sensing laser beams reflected from the reflector assembly and generating displacement, straightness, pitch, yaw and roll error signals, and means for mounting the laser measuring assembly to the table in three different orientations and for mounting the reflector assembly to the first element in three different orientations. In each of the orientations, the reflector assembly and the laser measuring assembly are aligned for measurement of parametric errors at a plurality of selected positions along the direction of the laser beam. The parametric errors along each direction of movement are stored in a computer. When a part is measured with the machine, the total errors are calculated at each measurement point, and the errors are subtracted from the scale readings.