The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 1989
Filed:
Oct. 11, 1985
Junichi Tamura, Ichihara, JP;
Ryoichi Hara, Ichihara, JP;
Fumihiko Abe, Ichihara, JP;
Hisashi Koaizawa, Ichihara, JP;
The Furukawa Electric Company, Ltd., Tokyo, JP;
Abstract
A method of analyzing a composition of an optical fiber base material to be measured by radioactive rays, which comprises the steps of irradiating radioactive rays from a radiation generator to the composition containing a plurality of elements or the substance, emitting the transmitted rays of the base material to a plurality of single crystals to produce several types of transmitted rays of specific energy, and measuring the transmitted rays by a radiation detector to analyze the compositions of the constituent elements in the base material. Thus, this method can accurately and economically analyze the composition in response to the constituent elements of the composition and the thickness of the composition.