The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 1989
Filed:
Feb. 15, 1989
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
In a method for quantitatively analyzing an analyte in a liquid sample by applying the liquid sample on one of a set of analytical elements and measuring a color developed in the analytical element through reflection photometory in which said set of analytical elements are the same elements as a standard element except for deviation of sensitivity to the analyte, but said deviation of sensitivity is essentially equivalent to each other among the set of analytical elements, the calibration curve of the standard element with respect to said analyte being predetermined, an improvement involving the preparation of a linear equation for defining a relationship between an optical reflection density value OD.sub.x to be measured on an analytical element belonging to said set of the analytical elements and an optical reflection density value OD.sub.s being predetermined on the standard analytical element, in which the optical reflection density values OD.sub.x and OD.sub.s are those to be determined on colors developed on the respective elements upon application of a liquid sample containing the analyte in the same content C.sub.x.