The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 1989

Filed:

Jan. 29, 1988
Applicant:
Inventor:

Charles B McKee, Jr, Fort Collins, CO (US);

Assignee:

In-Situ, Inc., Laramie, WY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 324 / ;
Abstract

An accurate analog measurement system is provided for reducing the effects, characterized by variations in gain and offset, that analog signals experience when transmitted from one point to another. The accurate analog measurement includes at least one transducer having a reference signal, scaling signal and output signal. The reference signal provides the baseline relative to which the scaling and output signals are measured. Indicative of the phenomena being measured by the transducer is the output signal. The scaling signal, preferably, represents the maximum possible output signal. The present invention also includes means for forcing the reference, scaling and output signals onto a common path so that each signal experiences the same variations when transmitted to a processing station of the present invention.


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