The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 1989

Filed:

Jun. 29, 1988
Applicant:
Inventors:

Hildegard Esser, 5000 Koln 41, DE;

Ulrich Grzesik, 5060 Bergisch Gladbach, DE;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250227 ; 2502 / ;
Abstract

The invention relates to a method of measuring the optical radiation energy reflected by a reflection place as a relative fraction of energy supplied by an optical transmitter via an optical line. Using few components, reliable and constantly exact measuring values can be obtained in that the optical line (12,25) is connected to a backscattering measuring device (1) (OTDR) which transmits radiation in known manner via an optical connector (5) and which comprises a reception and evaluation device (6 and 7, respectively) for forming a measuring value which is proportional to the optical power backscattered in the optical connector (5) of the backscattering measuring device (1) and in that a reflection element (17, 19) having known reflection factor R.sub.N is arranged in the optical path between the connector (5) of the OTDR (1) and the end of an optical path comprising the reflection area (9) to be examined.


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