The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 1989
Filed:
Feb. 29, 1988
Applicant:
Inventor:
Ran C Zeimer, Chicago, IL (US);
Assignee:
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; A61B / ;
U.S. Cl.
CPC ...
128665 ; 128745 ; 128774 ; 356382 ;
Abstract
A method and apparatus for measuring the retinal or nerve fiber layer thickness. A beam of light is focused on the retina. Reflected beams from the anterior and posterior surfaces of the retina are detected and analyzed to quantitavely determine the retinal thickness.
Zeimer, Ran. (1989). Method and apparatus for measuring the thickness of eye components (U.S. Patent No. 4883061). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4883061
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile