The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 1989

Filed:

Feb. 10, 1989
Applicant:
Inventor:

Masao Watari, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G10L / ; G10L / ;
U.S. Cl.
CPC ...
381 42 ; 381 43 ;
Abstract

A pattern matching system and method in which feature vectors of an input pattern to be identified are compared with a plurality of stored reference patterns in order to identify the input pattern. A number L of feature vectors from the input pattern and a feature vector from one of the reference patterns are read into a distance computation unit, under control of a pattern matching control unit. Inter-vector distances are calculated and passed to an asymptotic equation computation unit, which calculates an overall dissimilarity vector for each reference pattern. Because L feature vectors from the input pattern are read into the distance computation unit at a time, memory and reference pattern feature vector transfer requirements are decreased.


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