The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 1989
Filed:
Nov. 27, 1987
Heang K Tuy, Cleveland, OH (US);
Todd J Krochta, Akron, OH (US);
Frederick C Mailey, South Euclid, OH (US);
Hsayjern Lin, Richmond Heights, OH (US);
Picker International, Inc., Highland Hts., OH (US);
Abstract
A system for three-dimensional diagnostic imaging generates a plurality of slice images of a specimen. A region of interest is selected from within a slice and is extrapolated to subsequent slices. A boundary of indicative of a surface of interest is selected from within the region of interest to facilitate generation of an image representation of a three-dimensional surface of interest to be assembled from subsequent slices of the plurality. A viewing surface is defined in relation to a generated surface image which was selected from the boundary. A scaling means assigns a scaled gray level to the three-dimensional image to facilitate three-dimensional viewing of the object when it is projected on the viewing surface. Image information is selectably modified by data from the original slice images to add surface density visualization. Means is also provided to facilitate selective segmentation of a three-dimensional image along a plane or planes of interest. An interactive procedure is provided to facilitate cutting of a three-dimensional object from its perspective view (with or without density information).