The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 1989

Filed:

Mar. 07, 1988
Applicant:
Inventors:

Joerg Quittkat, Neuberg, DE;

Gerhard Thiel, Freigericht, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01N / ;
U.S. Cl.
CPC ...
324229 ; 324240 ; 324 / ;
Abstract

A monitoring system monitoring electrical components of an apparatus for electrodynamic wall-thickness and defect testing includes a transmitter generating brief signals. An electrodynamic converter has a transmitter coil connected to the transmitter for receiving the brief signals and feeding the brief signals into a workpiece to be tested in which the brief signals are reflected. The electrodynamic converter has a receiver coil receiving the reflected signals. An amplifier is connected to the receiver coil for receiving the reflected signals and an evaluation unit is connected to the amplifier for receiving the reflected signals. At least one damping element and a delay line are connected to the transmitter for delaying and damping the brief signals. The delay line is coupled through the electrodynamic converter to the evaluation unit for feeding the delayed and damped signals to the transmitter coil.


Find Patent Forward Citations

Quittkat, Joerg. (1989). Monitoring system for electrodynamic wall-thickness and defect testing (U.S. Patent No. 4882539). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4882539

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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