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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 4882484 B1

PDFFull Text
Date of Patent:
Nov. 21, 1989

Filed:

Oct. 31, 1988

Method of mass analyzing a sample by use of a quistor

Applicant:
Inventors:

Jochen Franzen, Bremen, DE;

Reemt-Holger Gabling, Bremen, DE;

Gerhard Heinen, Grasberg, DE;

Gerhard Weiss, Weyhe, DE;

Assignee:

The United States of America as represented by the Secretary of the Army, Washington, DC (US);

Attorneys:

Gibson; Robert P.

Goldberg; Edward

Sachs; Michael C.

Primary Examiner:

Jack I Berman

Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250282 ; 250290 ; 250291 ; 250292 ;
Abstract

In a quadrupole ion store (QUISTOR), a sample is analyzed by increasing the mplitude of the harmonic, or 'secular', oscillations of selected stably trapped ions so that they leave the trapping field. In a preferred embodiment, deviations from the ideal electrode geometry are incorporated into the QUISTOR to produce resonance phenomena between the r and z secular oscillations, thereby increasing the amplitude of oscillations in the z direction.

Find Patent Forward Citations

Franzen, Jochen. (1989). Method of mass analyzing a sample by use of a quistor (U.S. Patent No. 4882484). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4882484

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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