The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 1989
Filed:
Sep. 11, 1987
Applicant:
Inventors:
Assignee:
Hamamatsu Photonics Kabushiki Kaisha, Shizuoka, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ; H01J / ;
U.S. Cl.
CPC ...
2502 / ; 3131 / ;
Abstract
An apparatus is provided for detecting the one-dimensional position of incidence of particle beams. The apparatus comprises
Oba, Koichiro. (1989). Apparatus for detecting the position of incidence of particle beams (U.S. Patent No. 4882480). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4882480
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile