The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 1989

Filed:

Mar. 03, 1988
Applicant:
Inventors:

Yoshikatsu Sakai, Tokyo, JP;

Yasuo Nakai, Tokyo, JP;

Asao Miyabe, Tokyo, JP;

Takafumi Kawano, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B / ;
U.S. Cl.
CPC ...
364161 ; 364157 ;
Abstract

A controller in which proportional integral (PI) arithmetic is effected on a deviation between a measurement or process signal from a process or controlled system and a control set value, and a resultant manipulation signal is outputted to the process. A waveform of the process signal or the deviation signal is observed. PI arithmetic parameters undergo self-tuning so that the measurement result becomes a preset response target. In the preferred embodiment, means are provided for performing self-tuning on the PI arithmetic parameters including waveform observing means for using an area ratio of a first area to a second area as one of the evaluation indexes which represent patterns of the measured waveforms, the ratio being associated with the process signal or the deviation signal extending from a first generation timing of a first peak of the process signal or the deviation signal, to a subsequent second generation timing of a second peak, the second area being associated with the process signal or the deviation signal extending from the second generation timing to a timing given by second timing+(second timing - first timing).


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