The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 1989
Filed:
Jan. 20, 1988
Applicant:
Inventor:
Katsuhiro Takada, Tokyo, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350414 ; 350413 ;
Abstract
A microscope objective lens system comprising a plurality of lenses, at least one of the lenses being a graded refractive index lens (GRIN lens) whose refractive index varies as the radial distance from the optical axis varies, which is simpler in construction and in which aberrations are corrected sufficiently to a wide range of NA.