The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 1989

Filed:

Sep. 02, 1988
Applicant:
Inventors:

Wilhelm A Sauerwald, Eindhoven, NL;

Johannes DeWilde, Hilversum, NL;

Karel J Van Eerdewijk, Best, NL;

Franciscus P Beenker, Eindhoven, NL;

Marinus T Segers, Eindhoven, NL;

Assignee:

U.S. Philips Corp., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 223 ; 371 251 ;
Abstract

A method of testing an interconnection function between two integrated circuits which are mounted on a carrier and which are interconnected by data connections, for example a printed wiring board, is disclosed. The integrated circuits are also connected to a serial bus via which test patterns and result patterns can be communicated between a test device which can be connected thereto and the respective integrated circuits. The bus of a preferred embodiment is formed by a so-called I.sup.2 C bus. In a further elaboration, this set-up can also be used for testing the internal logic circuitry of the integrated circuits. For the testing of the interconnection function, input/output cells with a parallel connection for performing the normal execution function in a transparent mode are provided. They also include series connections for communication test/result patterns by way of a shift register.


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