The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 1989

Filed:

Feb. 19, 1988
Applicant:
Inventors:

Nikolaus Spiegel, Walldorf, DE;

Karlheinz Krestyn, Leimen, DE;

Theobald Blaser, Dielheim, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65H / ; G01B / ; G01D / ;
U.S. Cl.
CPC ...
324207 ; 271262 ; 271263 ; 340675 ;
Abstract

Device and method for measuring the thickness of paper or the like lying on a support, having a pull guide arranged above the paper including a pivot bearing with a lever mounted thereon, and a pull roller located at an end of the lever and engageable with the surface of a sheet of the paper arriving on the support, the pull guide also comprising a distance measuring device for measuring a vertical movement executed by the lever and for issuing a signal in proportion with the magnitude of the distance traversed by the movement, and a device connected to the distance measuring device for electronically evaluating the signal.


Find Patent Forward Citations

Spiegel, Nikolaus. (1989). Device for measuring paper or the like lying on a support (U.S. Patent No. 4879513). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4879513

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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