The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 1989
Filed:
Oct. 03, 1988
Applicant:
Inventors:
James B Hall, Chandler, AZ (US);
Martin G Robinson, Chandler, AZ (US);
Ronald C Swift, Mesa, AZ (US);
Assignee:
Motorola, Inc., Schaumburg, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G30B / ;
U.S. Cl.
CPC ...
156600 ; 156D / ; 156D / ; 437 13 ; 437939 ; 437946 ;
Abstract
A reduction in the number of impurities present in semiconductor wafers is obtained by gettering the impurities prior to mechanically lapping both wafer surfaces. Damage is created on both surfaces of the semiconductor wafer by the sawing of an ingot into many wafers. The impurities are then gettered to the damaged surfaces by subjecting the wafer to a high temperature. The subsequent lapping operation then removes the damaged regions along with the gettered impurities.