The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 1989
Filed:
Dec. 23, 1987
Roeland M Hekker, Fairfield, IA (US);
Izhak M Livny, Fairfield, IA (US);
Global Holonetics Corporation, Fairfield, IA (US);
Abstract
Operation of system components is automatically monitored, controlled and coordinated. The presence at an inspection station of each successive one of the objects to be inspected is automatically detected. Inspection of each such object commences in response to its detection when the monitoring of other system components indicates that they are ready for commencement of the new inspection cycle. The inspection system includes a rotatable disk having mask apertures that move into the line of sight of a light detector. Signals produced by scanning of timing marks upon the disk reflect which one of the plurality of masks is present in the optical path, and determine the intensity of the transform image sampled by said mask means.