The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 1989

Filed:

Feb. 06, 1986
Applicant:
Inventors:

Ying C Chen, Closter, NJ (US);

Jia-ming Liu, Arlington, MA (US);

Michael A Newkirk, Auburndale, MA (US);

Assignee:

GTE Laboratories Incorporated, Waltham, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; H01J / ; G01B / ; H01L / ;
U.S. Cl.
CPC ...
350 9614 ; 350 9611 ; 350 9612 ; 350 9613 ; 2502 / ; 356345 ; 357 30 ;
Abstract

An optically controlled semiconductor waveguide interferometer apparatus includes a Mach-Zehnder interferometer formed of semiconductor laser materials. A first optoelectronic switching means is adapted to be coupled across a first voltage potential and one of the optical paths of the interferometer. The first optoelectronic switching means has a first gap therein. Likewise, a second optoelectronic switching means is adapted to be coupled across a second voltage potential and the other of the optical paths. The second optoelectronic switching means has a respective gap therein. Light pulses are applied to the two gaps for controlling the index of refraction of the optical paths, whereby the light pulses control the interferometer so that the output intensity of the interferometer is modulated.


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