The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 1989
Filed:
Feb. 14, 1989
Applicant:
Inventors:
Tadashi Ichihashi, Tokyo, JP;
Masunori Kawamura, Tokyo, JP;
Assignee:
Kowa Company Ltd., , JP;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351214 ; 351221 ;
Abstract
A slit lamp microscope for use in observing the cornea, crystalline lens and other tissues of an eye includes a scanning device for scanning the laser beam vertically and horizontally within a selected area of the eye to be examined to form thereon a slit image which illuminates the selected area. A regulating device is provided for regulating the intensity of the laser beam to a predetermined level depending upon the amount of light reflected from the eye. The scanning device is controlled to change its scanning area to make the selected area variable to thereby provide a slit image which is changeable in size.