The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 1989
Filed:
Jan. 30, 1987
Applicant:
Inventors:
Albrecht Maurer, Seligenstadt, DE;
Josef Fabian, Hanau, DE;
Assignee:
Nukem GmbH, Hanau, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382-8 ; 73598 ; 356237 ; 358106 ; 382 34 ;
Abstract
The subject of the invention is a method and a device for detecting faults in or on an object. The object form is measured and then compared with a master form. In this comparison one point and one line of the object form and of the master form with reference to a coordinate system, are brought into coincidence by shifting the form or master form. Partial forms and partial master forms are then displaced relative to one another in partial areas of the coordinate system until a maximum overlap is detected. Then the nonoverlapping points of the partial forms are checked for faults.