The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 1989
Filed:
Aug. 06, 1987
Applicant:
Inventor:
Kevin M Killian, Hackensack, NJ (US);
Assignee:
Allied-Signal Inc., Morris County, Morris Township, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ; G01D / ;
U.S. Cl.
CPC ...
250227 ; 2502 / ; 2502 / ;
Abstract
Optical interferometric techniques are used in order to measure deflection in a cantilever beam. Light is directed through plural light paths which are changed in length during deflection of the beam. The light recombines and light interferance is used to measure deflection of the beams.